The invention relates to a method for making a wear sensor probe for an automobile brake pad

Release time：2020-08-03 The utility model belongs to the field of automobile sensors, and relates to a wear sensor probe used for automobile brake pads.Background technology:Brake pads wear alarm sensors as the car brake pads wear detection sensor components, through the sensor probe installation fixed in the base plate of the car brake pads, wear sensor probe together with the

　　The utility model belongs to the field of automobile sensors, and relates to a wear sensor probe used for automobile brake pads.

　　Background technology:

　　Brake pads wear alarm sensors as the car brake pads wear detection sensor components, through the sensor probe installation fixed in the base plate of the car brake pads, wear sensor probe together with the brake pads wear, began to wear when probe wear to a certain extent embedded in the probe wires, continue to wear until molding sensor wire loop grinding after disconnection alarm signals to the car ECU, remind the driver timely replacement of brake pads. However, there is a one-to-one correspondence between the existing wear sensor probe and the substrate, which causes certain difficulties for subsequent maintenance, replacement and installation, and it is easy to misinstall and not put in place.

　　Technical implementation elements:

　　To overcome the shortage of the existing technology, the utility model aims to provide a car brake pads wear sensor probe, the sensor probe can be implemented between the substrate and remove the assembly is simple and reliable, to achieve a sensor probe model can match a variety of types of brake pads, greatly improving the assembly is convenient maneuverability.

　　To achieve the above purposes, the technical scheme adopted by the utility model is as follows: a wear sensor probe used for automobile brake pads, including a probe body, the middle cylinder of the top surface of the probe body is provided with a ring card groove, and the middle cylinder is fixed and embedded with a metal buckle, the pin of the metal buckle is in contact with the base plate surface; The tail of the probe body is connected with the wire, and a metal protective sleeve is arranged on the outside of the wire.

　　The metal buckle is of ∪ type structure, and the distance between the bend surface and the top and bottom surface of the U-type structure constitutes a fixed part with the same thickness as the steel back.

　　The probe body is a high-temperature resistant material integrated forming.

　　The metal buckle is fixed in an annular card slot on the central cylinder, and there is at least one annular card slot. The Central Line of the annular card slot is parallel and equispaced and arranged.

　　The probe body is provided with an alarm line.